低密度

versailles项目对X射线光电子光谱仪的强度校准的高级材料和标准性研究使用低密度聚乙烯

Benjamen P. Reed* 1 , David J. H. Cant 1 , Steve J. Spencer 1 , Abraham Jorge Carmona-Carmona 2 , Adam Bushell 3 , Alberto Herrera-Gómez 2 , Akira Kurokawa 4 , Andreas Thissen 5 , Andrew G. Thomas 6 , Andrew J. Britton 7 , Andrzej Bernasik 8 , Anne Fuchs 9 , Arthur P. Baddorf 10 , Bernd Bock 11 , Bill Theilacker 12 , Bin Cheng 13 , David G. Castner 14 , David J. Morgan 15 , David Valley 16 , Elizabeth A. Willneff 17 , Emily F. Smith 18 , Emmanuel Nolot 19 , Fangyan Xie 20 , Gilad Zorn 21 , Graham C. Smith 22 , Hideyuki Yasufuku 23 , Jeffery Fenton 24 , Jian Chen 20 , Jonathan D. P. Counsell 25 , Jörg Radnik 26 , Karen J. Gaskell 27 , Kateryna Artyushkova 16 , Li Yang 28 , Lulu Zhang 4 , Makiho Eguchi 29 , Marc Walker 30 , Mariusz Hajdyła 8 , Mateusz M. Marzec 8 , Matthew R. Linford 31 , Naoyoshi Kubota 29 , Orlando Cortazar- Martínez2，Paul Dietrich 5，Riki Satoh 29，Sven L. M. Schroeder 7，Tahereh G. Avval 31，Takaharu Nagatomi 32，Vincent Fernandez 33，Wayne Lake 34，Wayne Lake 34，Yasushi Azuma 4，Yasushi Azuma 4，Yusuke Yusuke Yoshikawa 355,36，and Alexander G./alexander G.