机构名称：
¥ 1.0
Evaluation of Reliability and Lifetime of 650-V GaN-on-Si Power Devices Fabricated on 200-mm CMOS-Compatible Process Platform for High-Density Power Converter Application Shan Yin, Yiming Lin, Ronghui Hao, Shoudong Jin, Chuan He, Weigang Yao, Xingjun Li, Qingyuan He, Xiaoqing Pu, Xiaoliang Su, Yanbo Zou, Hui Cai, Kye-Jin Lee, Mike Wang, Harry Guo, Ke Shen, Felix Wang, H.-C. Chiu, Larry Chen, Denis Marcon, Roy K.-Y. Wong Innoscience Technology Co., Ltd., China
开幕式
主要关键词
相关文件推荐
