在半导体和绝缘纳米线和薄膜中,从边界粗糙度散射发出的降低的声子镜面P在较低的导热率中起主要作用。Although the well-known Ziman formula p = exp( − 4 σ 2 q 2 x ) , where σ and q x denote the root-mean-square boundary roughness and the normal component of the incident phonon wave vector, respectively, and its variants are commonly used in the literature to estimate how roughness attenuates p , their validity and accuracy remain poorly understood, especially when the effects of mode conversion cannot be ignored.在本文中,我们通过将其预测与从原子绿色功能(AGF)模拟中计算出的P值进行比较,从而研究了Ziman公式的更通用的Oggilvy公式的准确性和有效性,以获得单层石墨烯中粗糙边界的集合。分析了声子分散,入射角,极化,模式转换和相关长度的影响。我们的结果表明,对于0 ,Ogilvy公式非常准确