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• Complementary metal-oxide-semiconductor (CMOS) image sensors and charge coupled devices (CCD) • Image sensor design and customization • Sensor characterization and calibration • Radiation damage effects in space • Interaction of radiation with matter, shielding • Semiconductor physics and device simulations • Cryogenics and vacuum • Electronics
对硅检测器的VUV优化涂料技术的测试
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