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3D Three-dimensional ADC Analog-digital Converters Ag Silver APEX Advanced Photovoltaic Experiment APS Active Pixel Sensor ASET Analog Single-event Transient ASIC Application-specific Integrated Circuit BCH Bose–Chaudhuri–Hocquenghem BiCMOS Bipolar CMOS BJT Bipolar Junction Transistor BNL Brookhaven National Laboratory BoK Book of Knowledge Br Bromine CAD Computer-aided Design CCA Circuit Card Assembly CCD Charge-coupled Device CGS centimeter–gram–second CIS CMOS Image Sensor CL Confidence Level CMOS Complementary Metal Oxide Semiconductor CONOPS Concept of Operations COTS Commercial off the Shelf CRRES Combined Release and Radiation Effects Satellite CRUX Cosmic Ray Upset Experiment CTE Charge Transfer Efficiency DC Direct Current DDD Displacement Damage Dose DRAM Dynamic随机访问记忆DRM设计参考任务DSEE破坏性的单事件效应DSET DESED数字单事件瞬态DSNE设计规范，用于测试的EDAC错误检测和校正EEEE EEEE电气，电子，机电和电位电流ELDRE，并增强了低剂量评分的敏感性
航空电子辐射硬度保证（RHA）指南
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